Structural and morphological data of RF-Sputtered BiVO4 thin films

Publication date: Available online 2 February 2018
Source:Data in Brief
Author(s): R. Venkatesan, S. Velumani, K. Ordon, M. Makowska-Janusik, G. Corbel, A. Kassiba
Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.



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